Product IntroductionThe chip testing fixture is specially customized for various types of chips, with precise probe contact, stable signal transmission, convenient operation of the press fit structure, compatible with chip performance testing, suitable for research and development verification, mass production testing, and improving chip testing efficiency and reliability.
Material and process:Adopting high-precision positioning structure gold-plated probe module.
Applicable environment:Widely used in semiconductor research and development verification, mass production testing, aging screening, and other scenarios.
Product Features:Precise alignment, low contact impedance, standardized expansion interface, probe wear-resistant and fatigue resistant.
service life:5w-10w
Equipment parameters:Current: 10A, frequency: 20GHz.
