Product IntroductionThe double buckle test seat adopts an alloy double symmetrical buckle structure, with strong locking force and stable locking, which can completely solve problems such as high temperature aging, chip loosening, displacement, and signal interruption during long-term testing. Multi point balanced pressure design ensures uniform contact across the entire area, greatly improving the stability of test data.
Material and process:The buckle is fatigue resistant, has a long opening and closing life, and the base is heat-resistant and flame-retardant.
Applicable environment:Suitable for long-term continuous power on testing. Compatible with various types of packaging such as BGA, QFN, LGA, etc., it focuses on high load aging testing, life reliability testing, and large-scale stable burning scenarios.
Product Features:Double locking, stable and anti loosening, fatigue resistant, and suitable for long-term testing.
service life:5w-10w
Equipment parameters:Current 10A, frequency 20GHz
